Temperature dependent thermal conductivity of pure silica MEL and MFI zeolite thin films
نویسندگان
چکیده
منابع مشابه
Temperature dependent thermal conductivity of pure silica MEL and MFI zeolite thin films
zeolite thin films Jin Fang, Yi Huang, Christopher M. Lew, Yushan Yan, and Laurent Pilon Department of Mechanical and Aerospace Engineering, Henry Samueli School of Engineering and Applied Science, University of California-Los Angeles 420 Westwood Plaza, Los Angeles, California 90095, USA Department of Chemical Engineering and Materials Science, University of Minnesota Minneapolis, Minnesota 55...
متن کاملHydrophilicity of Silica Nano-Porous Thin Films: Calcination Temperature Effects
In this research work, silica nano-porous thin films were deposited on glass substrates by layer by layer method. The thin films were calcinated at various calcination temperatures (200, 300, 400, and 500 °C). The morphology, surface characteristics, surface roughness and hydrophilic properties of the thin films were investigated by field emission scanning electron microscopy, attenuated total ...
متن کاملReduced temperature-dependent thermal conductivity of magnetite thin films by controlling film thickness
We report on the out-of-plane thermal conductivities of epitaxial Fe3O4 thin films with thicknesses of 100, 300, and 400 nm, prepared using pulsed laser deposition (PLD) on SiO2/Si substrates. The four-point probe three-omega (3-ω) method was used for thermal conductivity measurements of the Fe3O4 thin films in the temperature range of 20 to 300 K. By measuring the temperature-dependent thermal...
متن کاملTEM investigation of formation mechanism of monocrystal-thick b-oriented pure silica zeolite MFI film.
The first direct transmission electron microscopic (TEM) observation has been carried out on the continuous monocrystal-thick b-oriented pure silica zeolite MFI films produced by in situ crystallization. The self-supporting film samples for TEM study were fabricated by dissolving the steel substrate with acid. This TEM study is free of those artifacts that are typically associated with TEM samp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2012
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.3692754